Search results for “[subject: electron-microscopes-microscopy]”

• Author(s): Joseph Goldstein • Publisher: Springer • Publisher Imprint: Springer • BISAC: Microscopes & MicroscopyIn the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes mi...

• Author(s): John Hren • Publisher: Springer • Publisher Imprint: Springer • BISAC: Microscopes & MicroscopyThe birth of analytical electron microscopy (AEM) is somewhat obscure. Was it the recognition of the power and the development of STEM...

• Author(s): Charles E. Lyman • Publisher: Springer • Publisher Imprint: Springer • BISAC: Electron Microscopes & MicroscopyDuring the last four decades remarkable developments have taken place in instrumentation and techniques for characteri...

• Author(s): Goerg H. Michler • Publisher: Springer • Publisher Imprint: Springer • BISAC: Spectroscopy & Spectrum AnalysisFrom the Back CoverGoerg Michler summarizes the large field of electron microscopy and clearly presents the different t...

• Author(s): R. F. Egerton • Publisher: Springer • Publisher Imprint: Springer • BISAC: Materials Science - GeneralFrom the Back CoverThis popular textbook provides an introduction to the theory and practice of electron microscopy. The second edi...

• Author(s): Nobuo Tanaka • Publisher: Springer • Publisher Imprint: Springer • BISAC: Chemistry - AnalyticFrom the Back CoverIn this second edition, most chapters of the first edition, which published in 2017, have been revised and recent advanc...

• Author(s): John Kuo • Publisher: Springer • Publisher Imprint: Humana • BISAC: BiochemistryFrom the Back CoverThis third edition of Electron Microscopy: Methods and Protocols expands upon the previous editions with current, detailed protocols o...

• Author(s): Krishanu Biswas • Publisher: Springer • Publisher Imprint: Springer • BISAC: Materials Science - GeneralFrom the Back CoverThis issue of Direction focuses on the rapid proliferation of electron microscopy (EM) for scientific as well ...

• Author(s): James Pawley • Publisher: Springer • Publisher Imprint: Springer • BISAC: Electron Microscopes & MicroscopyFrom the Back CoverField-emission, low-voltage scanning electron microscopy (LVSEM) is a field that has grown tremendously...

• Author(s): Krishanu Biswas • Publisher: Springer • Publisher Imprint: Springer • BISAC: Materials Science - GeneralFrom the Back CoverThis issue of Direction focuses on the rapid proliferation of electron microscopy (EM) for scientific as well ...

• Author(s): Michael J. Dykstra • Publisher: Springer • Publisher Imprint: Springer • BISAC: Electron Microscopes & MicroscopyElectron microscopy is frequently portrayed as a discipline that stands alone, separated from molecular biology, lig...

• Author(s): Theodore G. Rochow • Publisher: Springer • Publisher Imprint: Springer • BISAC: Microscopes & MicroscopyFollowing three printings of the First Edition (1978), the publisher has asked for a Second Edition to bring the contents up ...

• Author(s): Edgar Volkl • Publisher: Springer • Publisher Imprint: Plenum Publishing Corporation • BISAC: Electron Microscopes & MicroscopyValid Conventions throughout the Book. 1. The History of the Electron Biprism. 2. Principles and Theor...

• Author(s): Patrick Echlin • Publisher: Springer • Publisher Imprint: Springer • BISAC: Electron Microscopes & MicroscopyThis book has its origins in the intensive short courses on scanning elec- tron microscopy and x-ray microanalysis which...

• Author(s): Theodore G. Rochow • Publisher: Springer • Publisher Imprint: Springer • BISAC: Microscopes & MicroscopyFollowing three printings of the First Edition (1978), the publisher has asked for a Second Edition to bring the contents up ...

• Author(s): Adam J. Schwartz • Publisher: Springer • Publisher Imprint: Springer • BISAC: Materials Science - GeneralFrom the Back CoverElectron backscatter diffraction (EBSD), when employed as an additional characterization technique to a scann...

• Author(s): Xiao-Feng Zhang • Publisher: Springer • Publisher Imprint: Springer • BISAC: Electron Microscopes & MicroscopyFrom the Back CoverTransmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. Thi...

• Author(s): J. K. Koehler • Publisher: Springer • Publisher Imprint: Springer • BISAC: Life Sciences - Cell BiologyThis volume is a continuation of two prior books on advanced electron microscope techniques. The purpose of this series has been t...

• Author(s): Nobuo Tanaka • Publisher: Springer • Publisher Imprint: Springer • BISAC: Materials Science - GeneralFrom the Back CoverIn the present book, the basics of imaging and diffraction in transmission electron microscopy (TEM) and scanning...

• Author(s): R. F. Egerton • Publisher: Springer • Publisher Imprint: Springer • BISAC: Electron Microscopes & MicroscopyScanning and stationary-beam electron microscopes have become indispensable tools for both research and routine evaluatio...

• Author(s): P. W. Hawkes • Publisher: Springer • Publisher Imprint: Springer • BISAC: Electron Microscopes & MicroscopyFrom the Back CoverScanning Electron Microscopy provides a description of the physics of electron-probe formation and of e...

• Author(s): P. W. Hawkes • Publisher: Springer • Publisher Imprint: Springer • BISAC: Electron Microscopes & MicroscopyFrom the Back CoverScanning Electron Microscopy provides a description of the physics of electron-probe formation and of e...

• Author(s): Xiao-Feng Zhang • Publisher: Springer • Publisher Imprint: Springer • BISAC: Electron Microscopes & MicroscopyFrom the Back CoverTransmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. Thi...

• Author(s): Joseph Goldstein • Publisher: Springer • Publisher Imprint: Springer • BISAC: Earth Sciences - GeneralIn the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has b...

• Author(s): L. Reimer | G. Pfefferkorn • Publisher: Springer • Publisher Imprint: Springer • BISAC: Physics - Condensed Matter1. 1. Prinzipielle Wirkungsweise und Betriebsarten eines Raster-Elektron- mikroskopes (SEM) . . . . . . . . . . . . . ....

• Author(s): Eugene Rochow • Publisher: Springer • Publisher Imprint: Springer • BISAC: Engineering (General)Many people look upon a microscope as a mere instrument(l); to them microscopy is instrumentation. Other people consider a microscope to ...

• Author(s): Edgar Völkl • Publisher: Springer • Publisher Imprint: Springer • BISAC: Electron Microscopes & MicroscopyExperienced and novice holographers receive a solid foundation in the theory and practice of holography, the next generatio...

• Author(s): J. M. Zuo • Publisher: Springer • Publisher Imprint: Springer • BISAC: Electron Microscopes & MicroscopyMuch of this book was written during a sabbatical visit by J. C. H. S. to the Max Planck Institute in Stuttgart during 1991. ...

• Author(s): L. Reimer • Publisher: Springer • Publisher Imprint: Springer • BISAC: Physics - General

• Author(s): Manfred Von Ardenne • Publisher: Springer • Publisher Imprint: Springer • BISAC: Spectroscopy & Spectrum AnalysisDieser Buchtitel ist Teil des Digitalisierungsprojekts Springer Book Archives mit Publikationen, die seit den Anf�ng...

• Author(s): Daisuke Shindo | T. Oikawa • Publisher: Springer • Publisher Imprint: Springer • BISAC: AstronomyAnalytical electron microscopy is one of the most powerful tools today for characterization of the advanced materials that support the n...

• Author(s): Jeanne Ayache • Publisher: Springer • Publisher Imprint: Springer • BISAC: Electron Microscopes & MicroscopyFrom the Back CoverThis two-volume Handbook is a comprehensive and authoritative guide to sample preparation for the tran...

• Author(s): Thomas Vogt • Publisher: Springer • Publisher Imprint: Springer • BISAC: Chemistry - AnalyticFrom the Back CoverModeling Nanoscale Imaging in Electron Microscopy presents the recent advances that have been made using mathematical met...

• Author(s): Jian Min Zuo • Publisher: Springer • Publisher Imprint: Springer • BISAC: Materials Science - GeneralFrom the Back CoverThis volume expands and updates the coverage in the authors' classic 1992 book, "Electron Microdiffraction." As t...

• Author(s): Sathish-Kumar Kamaraj • Publisher: Springer • Publisher Imprint: Springer • BISAC: ResearchFrom the Back CoverThis book covers fundamental microscopic techniques for Scanning Electron Microscopy (SEM), Transmission Electron Microscop...

• Author(s): David C. Joy • Publisher: Springer • Publisher Imprint: Springer • BISAC: Materials Science - GeneralFrom the Back CoverHelium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of wh...