Skip to content

Booksellers & Trade Customers: Sign up for online bulk buying at trade.atlanticbooks.com for wholesale discounts

Booksellers: Create Account on our B2B Portal for wholesale discounts

Search results for “[subject: electron-microscopes-microscopy]”

Filters

Products

Applied Scanning Probe Methods: Characterization

Bharat Bhushan, Satoshi Kawata

Hardcover

Current price ₹9,603
Original price ₹19,205
Original price ₹19,205
Original price ₹19,205
(-50%)
₹9,603
Current price ₹9,603

• Author(s): Bharat Bhushan | Satoshi Kawata • Publisher: Springer Verlag • Publisher Imprint: Springer V • Subject: Engineering • BISAC: Nanotechnology & MEMSThe scanning probe microscopy ?eld has been rapidly expanding. It is a demanding ta...

View full details