Skip to content

Booksellers & Trade Customers: Sign up for online bulk buying at trade.atlanticbooks.com for wholesale discounts

Booksellers: Create Account on our B2B Portal for wholesale discounts

Advanced Laser Diode Reliability

by Massimo Vanzi
Save 40% Save 40%
Current price ₹7,035.00
Original price ₹11,725.00
Original price ₹11,725.00
Original price ₹11,725.00
(-40%)
₹7,035.00
Current price ₹7,035.00

Imported Edition - Ships in 18-21 Days

Free Shipping in India on orders above Rs. 500

Request Bulk Quantity Quote
+91
Book cover type: Hardcover
  • ISBN13: 9781785481543
  • Binding: Hardcover
  • Subject: N/A
  • Publisher: Iste Press - Elsevier
  • Publisher Imprint: Iste Press - Elsevier
  • Publication Date:
  • Pages: 268
  • Original Price: USD 125.0
  • Language: English
  • Edition: N/A
  • Item Weight: 531 grams
  • BISAC Subject(s): Electronics / Solid State

Advanced Laser Diode Reliability focuses on causes and effects of degradations of state-of-the-art semiconductor laser diodes. It aims to provide a tool for linking practical measurements to physical diagnostics. To this purpose, it reviews the current technologies, addressing their peculiar details that can promote specific failure mechanisms. Two sections will support this kernel: a) Failure Analysis techniques, procedures and examples; b) Device-oriented laser modelling and parameter extraction.

Bechou, Laurent: - Laurent Béchou is Full Professor in Electronics and Physics at the University of Bordeaux, France, and Visiting Senior Researcher at the Laboratoire Nanotechnologies et Nanosystèmes (CNRS) at the University of Sherbrooke, Canada. His research mainly addresses advanced electro-optical characterization techniques, physical and failure mechanisms modeling, as well as statistical methods for lifetime prediction of optical devices and emerging photonic systems.

Fukuda, Mitsuo: - Mitsuo Fukuda is Senior Researcher and Professor Emeritus studying plasmonic devices at the Toyohashi University of Technology, Japan. Previously, he was a researcher studying optical semiconductor devices used for various optical fiber communication systems at the NTT Electrical Communication Laboratories.

Mura, Giovanna: - Giovanna Mura is Assistant Professor at the University of Cagliari. Her research is mainly focused on failure physics, diagnostics of microelectronics by electron microscopy (SEM and TEM) and general methods for reliability with a special emphasis on photonic devices.

Vanzi, Massimo: - Massimo Vanzi is Full Professor of Electronics at the University of Cagliari, Italy. Previously, he worked for 14 years at the Italian telecom company, Telettra, in the Quality and Reliability Department. His research focuses on general reliability, failure physics and diagnostics of solid state devices

Trusted for over 49 years

Family Owned Company

Secure Payment

All Major Credit Cards/Debit Cards/UPI & More Accepted

New & Authentic Products

India's Largest Distributor

Need Support?

Whatsapp Us