Skip to content

Booksellers & Trade Customers: Sign up for online bulk buying at trade.atlanticbooks.com for wholesale discounts

Booksellers: Create Account on our B2B Portal for wholesale discounts

Assessing Fault Model and Test Quality

by Kenneth M. Butler
Save 35% Save 35%
Current price ₹7,277.00
Original price ₹11,194.00
Original price ₹11,194.00
Original price ₹11,194.00
(-35%)
₹7,277.00
Current price ₹7,277.00

Imported Edition - Ships in 12-14 Days

Free Shipping in India on orders above Rs. 500

Request Bulk Quantity Quote
+91
Book cover type: Hardcover
  • ISBN13: 9780792392224
  • Binding: Hardcover
  • Subject: N/A
  • Publisher: Springer
  • Publisher Imprint: Springer
  • Publication Date:
  • Pages: 132
  • Original Price: EUR 99.99
  • Language: English
  • Edition: 1992
  • Item Weight: 400 grams
  • BISAC Subject(s): Electronics / Circuits / General, Design, Graphics & Media / CAD-CAM, and Electrical

For many years, the dominant fault model in automatic test pattern gen- eration (ATPG) for digital integrated circuits has been the stuck-at fault model. The static nature of stuck-at fault testing when compared to the extremely dynamic nature of integrated circuit (IC) technology has caused many to question whether or not stuck-at fault based testing is still viable. Attempts at answering this question have not been wholly satisfying due to a lack of true quantification, statistical significance, and/or high computational expense. In this monograph we introduce a methodology to address the ques- tion in a manner which circumvents the drawbacks of previous approaches. The method is based on symbolic Boolean functional analyses using Or- dered Binary Decision Diagrams (OBDDs). OBDDs have been conjectured to be an attractive representation form for Boolean functions, although cases ex- ist for which their complexity is guaranteed to grow exponentially with input cardinality. Classes of Boolean functions which exploit the efficiencies inherent in OBDDs to a very great extent are examined in Chapter 7. Exact equa- tions giving their OBDD sizes are derived, whereas until very recently only size bounds have been available. These size equations suggest that straight- forward applications of OBDDs to design and test related problems may not prove as fruitful as was once thought.

Trusted for over 49 years

Family Owned Company

Secure Payment

All Major Credit Cards/Debit Cards/UPI & More Accepted

New & Authentic Products

India's Largest Distributor

Need Support?

Whatsapp Us