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Beam Diagnostics in Superconducting Accelerating Cavities: The Extraction of Transverse Beam Position from Beam-Excited Higher Order Modes

by Pei Zhang
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Current price ₹7,345.00
Original price ₹11,299.00
Original price ₹11,299.00
Original price ₹11,299.00
(-35%)
₹7,345.00
Current price ₹7,345.00

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Book cover type: Paperback
  • ISBN13: 9783319346168
  • Binding: Paperback
  • Subject: N/A
  • Publisher: Springer
  • Publisher Imprint: Springer
  • Publication Date:
  • Pages: 118
  • Original Price: EUR 99.99
  • Language: English
  • Edition: Softcover Repri
  • Item Weight: 199 grams
  • BISAC Subject(s): Physics / Nuclear, Physics / Mathematical & Computational, and Physics / Electricity

From the Back Cover

This work employs self-excited wakefields as a diagnostic to remotely determine the beam position within a superconducting cavity and chains thereof. Several numerical techniques are delineated in order to ascertain the most appropriate technique in terms of reliability and accuracy. The methodology is carefully explained making the presentation pedagogically appropriate to students new to the field as well as researchers familiar with this topic. Pei Zhang's achievements will serve as a basis for the development of similar monitors at various other facilities around the world.

The author read physics at the University of Science and Technology of China (USTC) in Hefei from 2002 to 2006. After graduating with a BSc in applied physics, he worked at CERN in Geneva for one year as a visiting scholar employed by the University of Michigan (Ann Arbor). In 2009, he was awarded a MSc in Particle Physics from USTC. Subsequently he joined the accelerator group at the University of Manchester to pursue a Ph.D. and was based at DESY (Hamburg). After successfully defending his Ph.D. thesis in December 2012, he joined the BE-RF group at CERN as a Marie-Curie Experienced Researcher.

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