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Carrier Transport in Nanoscale Mos Transistors

by Hideaki Tsuchiya
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Current price ₹8,163.00
Original price ₹12,558.00
Original price ₹12,558.00
Original price ₹12,558.00
(-35%)
₹8,163.00
Current price ₹8,163.00

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Book cover type: Hardcover
  • ISBN13: 9781118871669
  • Binding: Hardcover
  • Subject: N/A
  • Publisher: Wiley-IEEE Press
  • Publisher Imprint: Wiley-IEEE Press
  • Publication Date:
  • Pages: 450
  • Original Price: USD 130.0
  • Language: English
  • Edition: N/A
  • Item Weight: 545 grams
  • BISAC Subject(s): Electronics / Microelectronics

A comprehensive advanced level examination of the transport theory of nanoscale devices *Provides advanced level material of electron transport in nanoscale devices from basic principles of quantum mechanics through to advanced theory and various numerical techniques for electron transport *Combines several up-to-date theoretical and numerical approaches in a unified manner, such as Wigner-Boltzmann equation, the recent progress of carrier transport research for nanoscale MOS transistors, and quantum correction approximations *The authors approach the subject in a logical and systematic way, reflecting their extensive teaching and research backgrounds

Hideaki Tsuchiya, Associate Professor, Kobe University, Japan. Professor Tsuchiya received his Ph. D in electronic engineering from Kobe University, Kobe, Japan, in 1993. He has lectured for over ten years to graduate students on the Advanced Theory of Integrated Nanoscale Devices. His research interests focus on quantum transport simulation and atomistic modeling of nanoscale devices. He has co-written over 100 journals articles and Proceedings.

Yoshinari Kamakura, Associate Professor, Department of Electrical, Electronic and Information Engineering, Graduate School of Engineering, Osaka University, Japan. Professor Kamakura obtained his PhD from Osaka University in 1994 and has worked in various roles at the same institution. His research interests include semiconductor device engineering and he has co-authored a number of journals articles on the subject. He is a member of the IEEE.

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