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Characterization of Integrated Bragg Gratings In Silicon-on-Insulator

by Tashtush Aktham
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Current price ₹3,674.00
Original price ₹4,190.00
Original price ₹4,190.00
Original price ₹4,190.00
(-12%)
₹3,674.00
Current price ₹3,674.00

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Book cover type: Paperback
  • ISBN13: 9783659623134
  • Binding: Paperback
  • Subject: N/A
  • Publisher: LAP Lambert Academic Publishing
  • Publisher Imprint: LAP Lambert Academic Publishing
  • Publication Date:
  • Pages: 68
  • Original Price: GBP 33.12
  • Language: English
  • Edition: N/A
  • Item Weight: 114 grams
  • BISAC Subject(s): Electronics / General

Silicon-on-insulator (SOI) is rapidly emerging as a very promising material platform for integrated photonics. As it combines the potential for optoelectronic integration with the low-cost and large volume manufacturing capabilities and they are already accumulate a huge amount of applications in areas like sensing, quantum optics, optical telecommunications and metrology. One of the main limitations of current technology is that waveguide propagation losses are still much higher than in standard glass-based platform because of many reasons such as bends, surface roughness and the very strong optical confinement provided by SOI. Such high loss prevents the fabrication of efficient optical resonators and complex devices severely limiting the current potential of the SOI platform.

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