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Controlling the aging of power transistors

by Tarek Ben Salah , Stéphane Lefebvre , Douha Othmen
Save 12% Save 12%
Current price ₹5,871.00
Original price ₹6,702.00
Original price ₹6,702.00
Original price ₹6,702.00
(-12%)
₹5,871.00
Current price ₹5,871.00

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Book cover type: Paperback
  • ISBN13: 9786208939458
  • Binding: Paperback
  • Subject: N/A
  • Publisher: Our Knowledge Publishing
  • Publisher Imprint: Our Knowledge Publishing
  • Publication Date:
  • Pages: 88
  • Original Price: GBP 52.98
  • Language: English
  • Edition: N/A
  • Item Weight: 127 grams
  • BISAC Subject(s): Electronics / General

This book presents an in-depth experimental study of the behavior of SiC JFET transistors for demanding aerospace applications. A complete methodology is described, including the design of an automated test bench via LabView, robustness tests to determine the critical energy, and accelerated aging tests to monitor the evolution of electrical parameters. The results obtained highlight reliable degradation indicators and open up interesting prospects for the design of more resistant electronic systems in extreme environments.

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