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Data-Driven Fault Detection for Industrial Processes: Canonical Correlation Analysis and Projection Based Methods

by Zhiwen Chen
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Current price ₹5,450.00
Original price ₹8,384.00
Original price ₹8,384.00
Original price ₹8,384.00
(-35%)
₹5,450.00
Current price ₹5,450.00

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Book cover type: Paperback
  • ISBN13: 9783658167554
  • Binding: Paperback
  • Subject: N/A
  • Publisher: Springer
  • Publisher Imprint: Springer Vieweg
  • Publication Date:
  • Pages: 112
  • Original Price: EUR 74.99
  • Language: English
  • Edition: 2017
  • Item Weight: 180 grams
  • BISAC Subject(s): Automation, Applied, and Probability & Statistics / General

From the Back Cover
Zhiwen Chen aims to develop advanced fault detection (FD) methods for the monitoring of industrial processes. With the ever increasing demands on reliability and safety in industrial processes, fault detection has become an important issue. Although the model-based fault detection theory has been well studied in the past decades, its applications are limited to large-scale industrial processes because it is difficult to build accurate models. Furthermore, motivated by the limitations of existing data-driven FD methods, novel canonical correlation analysis (CCA) and projection-based methods are proposed from the perspectives of process input and output data, less engineering effort and wide application scope. For performance evaluation of FD methods, a new index is also developed.
Contents

  • A New Index for Performance Evaluation of FD Methods
  • CCA-based FD Method for the Monitoring of Stationary Processes
  • Projection-based FD Method for the Monitoring of Dynamic Processes
  • Benchmark Study and Real-Time Implementation
Target Groups
  • Researchers and students in the field of process control and statistical hypothesis testing
  • Research and development engineers in the process industry
About the AuthorZhiwen Chen's research interests include multivariate statistical process monitoring, model-based and data-driven fault diagnosis as well as their application to industrial processes. He is currently working at the School of Information Science and Engineering at Central South University, China.

Zhiwen Chen's research interests include multivariate statistical process monitoring, model-based and data-driven fault diagnosis as well as their application to industrial processes. He is currently working at the School of Information Science and Engineering at Central South University, China.


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