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Digital Integrated Circuit Testing from a Quality Perspective

by Eugene R. Hnatek
Save 35% Save 35%
Current price ₹7,345.00
Original price ₹11,299.00
Original price ₹11,299.00
Original price ₹11,299.00
(-35%)
₹7,345.00
Current price ₹7,345.00

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Book cover type: Hardcover
  • ISBN13: 9780442006433
  • Binding: Hardcover
  • Subject: N/A
  • Publisher: Springer
  • Publisher Imprint: Springer
  • Publication Date:
  • Pages: 180
  • Original Price: EUR 99.99
  • Language: English
  • Edition: 1993
  • Item Weight: 477 grams
  • BISAC Subject(s): Electronics / Circuits / General and Electrical

Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a

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