Skip to content

Booksellers & Trade Customers: Sign up for online bulk buying at trade.atlanticbooks.com for wholesale discounts

Booksellers: Create Account on our B2B Portal for wholesale discounts

Dynamic Characterisation of Analogue-To-Digital Converters

by Dominique Dallet
Save 35% Save 35%
Current price ₹11,017.00
Original price ₹16,949.00
Original price ₹16,949.00
Original price ₹16,949.00
(-35%)
₹11,017.00
Current price ₹11,017.00

Imported Edition - Ships in 12-14 Days

Free Shipping in India on orders above Rs. 500

Request Bulk Quantity Quote
+91
Book cover type: Paperback
  • ISBN13: 9781441938497
  • Binding: Paperback
  • Subject: N/A
  • Publisher: Springer
  • Publisher Imprint: Springer
  • Publication Date:
  • Pages: 280
  • Original Price: EUR 149.99
  • Language: English
  • Edition: N/A
  • Item Weight: 456 grams
  • BISAC Subject(s): Weights & Measures, Measurement, and Mechanical

The Analogue-to-digital converter (ADC) is the most pervasive block in electronic systems. With the advent of powerful digital signal processing and digital communication techniques, ADCs are fast becoming critical components for system's performance and flexibility. Knowing accurately all the parameters that characterise their dynamic behaviour is crucial, on one hand to select the most adequate ADC architecture and characteristics for each end application, and on the other hand, to understand how they affect performance bottlenecks in the signal processing chain.

Dynamic Characterisation of Analogue-to-Digital Converters presents a state of the art overview of the methods and procedures employed for characterising ADCs' dynamic performance behaviour using sinusoidal stimuli. The three classical methods - histogram, sine wave fitting, and spectral analysis - are thoroughly described, and new approaches are proposed to circumvent some of their limitations.

This is a must-have compendium, which can be used by both academics and test professionals to understand the fundamental mathematics underlining the algorithms of ADC testing, and as an handbook to help the engineer in the most important and critical details for their implementation.

Dallet, Dominique obtained his PhD degree in Electrical Engineering in 1995 from the University of Bordeaux 1, where he is currently a professor at the Electronic Engineering School of Bordeaux (ENSEIRB). His main research activities, carried-out at the IXL laboratory, focus on mixed-signal circuit design and testing, digital and analogue signal processing, and programmable devices' applications. His interests include also digital design and its application in BIST structures for the characterization of embedded A/D converters, as well as, digital signal processing applied to nondestructive techniques based on time-frequency representation.

Machado da Silva, José received the Licenciatura and PhD, both in Electrical and Computer Engineering from the Faculdade de Engenharia da Universidade do Porto (FEUP), Portugal, in 1984 and 1998, respectively. He is currently an Assistant Professor at FEUP and a project leader at Instituto de Engenharia de Sistemas e de Computadores (INESC-Porto), with teaching and research responsibilities on design and testing of electronic circuits. His research interests include analogue and mixed-signal design for testability, new testing methodologies, analogue and digital signal processing, and VLSI design.

Trusted for over 49 years

Family Owned Company

Secure Payment

All Major Credit Cards/Debit Cards/UPI & More Accepted

New & Authentic Products

India's Largest Distributor

Need Support?

Whatsapp Us