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Electrical Atomic Force Microscopy for Nanoelectronics

by Umberto Celano
Save 35% Save 35%
Current price ₹12,371.00
Original price ₹19,031.00
Original price ₹19,031.00
Original price ₹19,031.00
(-35%)
₹12,371.00
Current price ₹12,371.00

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Book cover type: Hardcover
  • ISBN13: 9783030156114
  • Binding: Hardcover
  • Subject: N/A
  • Publisher: Springer
  • Publisher Imprint: Springer
  • Publication Date:
  • Pages: 408
  • Original Price: EUR 169.99
  • Language: English
  • Edition: 2019
  • Item Weight: 776 grams
  • BISAC Subject(s): Spectroscopy & Spectrum Analysis, Materials Science / Electronic Materials, and Electronics / General

From the Back Cover

The tremendous impact of electronic devices on our lives is the result of continuous improvements of the billions of nanoelectronic components inside integrated circuits (ICs). However, ultra-scaled semiconductor devices require nanometer control of the many parameters essential for their fabrication. Through the years, this created a strong alliance between microscopy techniques and IC manufacturing. This book reviews the latest progress in IC devices, with emphasis on the impact of electrical atomic force microscopy (AFM) techniques for their development. The operation principles of many techniques are introduced, and the associated metrology challenges described. Blending the expertise of industrial specialists and academic researchers, the chapters are dedicated to various AFM methods and their impact on the development of emerging nanoelectronic devices. The goal is to introduce the major electrical AFM methods, following the journey that has seen our lives changed by the advent of ubiquitous nanoelectronics devices, and has extended our capability to sense matter on a scale previously inaccessible.


Umberto Celano is a senior research scientist at imec (Belgium), where his interests encompass solid-state physics and materials science for application in nanoelectronics and emerging devices. In this area, he conducted research at the border between engineering and fundamental science in various institutions such as KU Leuven, Osaka University, and Stanford University. He received his Ph.D. in Physics from the University of Leuven in 2015. Previously, Umberto obtained a B.Eng. in Electronic Engineering and an M.Sc. degree in Nanoelectronics from the University of Rome Sapienza, Italy.


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