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Electromigration

by Linghong Li
Save 12% Save 12%
Current price ₹4,509.00
Original price ₹5,145.00
Original price ₹5,145.00
Original price ₹5,145.00
(-12%)
₹4,509.00
Current price ₹4,509.00

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Book cover type: Paperback
  • ISBN13: 9783639088137
  • Binding: Paperback
  • Subject: N/A
  • Publisher: VDM Verlag Dr. Mueller E.K.
  • Publisher Imprint: VDM Verlag Dr. Mueller E.K.
  • Publication Date:
  • Pages: 76
  • Original Price: GBP 40.67
  • Language: English
  • Edition: N/A
  • Item Weight: 114 grams
  • BISAC Subject(s): Physics / General

Electromigration is a microscopic phenomenon involving electric field-induced diffusion, which is very relevant to damage in interconnections. A common method for monitoring interconnection degradation is through electrical resistance measurements, which requires direct electrical contact. It is desirable to develop non-contact methods to monitor electromigration damage formation. In this thesis, we propose a novel Optical Microscopy Imaging Method (OMIM), and we provide a theoretical description and experimental results. OMIM not only pro-vides a new method for studying electromigration, but also provides a useful method for studying other micro-devices and materials in a non-contact mode.

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