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Electromigration and Electronic Device Degradation

by Aris Christou
Save 12% Save 12%
Current price ₹23,840.00
Original price ₹27,192.00
Original price ₹27,192.00
Original price ₹27,192.00
(-12%)
₹23,840.00
Current price ₹23,840.00

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Book cover type: Hardcover
  • ISBN13: 9780471584896
  • Binding: Hardcover
  • Subject: N/A
  • Publisher: Wiley-Interscience
  • Publisher Imprint: Wiley-Interscience
  • Publication Date:
  • Pages: 343
  • Original Price: GBP 214.95
  • Language: English
  • Edition: N/A
  • Item Weight: 685 grams
  • BISAC Subject(s): Electronics / Circuits / General and Electrical

Addresses electromigration failure modes in electronics covering both theory and experiments. Reviews silicon and GaAs technologies. Various rate controlling details are summarized including an investigation of temperature dependence. Concludes with a discussion regarding current status and future plans for electromigration resistant advanced metallization systems for VLSI.

Aris Christou is the author of Electromigration and Electronic Device Degradation, published by Wiley.

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