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Electromigration in Thin Films and Electronic Devices: Materials and Reliability

by Choong-Un Kim , C-U Kim , Choong-Un Kim
Save 17% Save 17%
Current price ₹25,204.00
Original price ₹30,245.00
Original price ₹30,245.00
Original price ₹30,245.00
(-17%)
₹25,204.00
Current price ₹25,204.00

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Book cover type: Paperback
  • ISBN13: 9780081016961
  • Binding: Paperback
  • Subject: N/A
  • Publisher: Woodhead Publishing
  • Publisher Imprint: Woodhead Publishing
  • Publication Date:
  • Pages: 352
  • Original Price: GBP 177.0
  • Language: English
  • Edition: Reprint
  • Item Weight: 495 grams
  • BISAC Subject(s): Materials Science / General

Understanding and limiting electromigration in thin films is essential to the continued development of advanced copper interconnects for integrated circuits. "Electromigration in Thin Films and Electronic Devices" provides an up-to-date review of key topics in this commercially important area.

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