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Exponential Fatigue Life Model for Single-Edge-Notched Beams

by Avaya Kumar Baliarsingh , Debabrata Rath
Save 12% Save 12%
Current price ₹4,236.00
Original price ₹4,832.00
Original price ₹4,832.00
Original price ₹4,832.00
(-12%)
₹4,236.00
Current price ₹4,236.00

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Book cover type: Paperback
  • ISBN13: 9786209272837
  • Binding: Paperback
  • Subject: N/A
  • Publisher: LAP Lambert Academic Publishing
  • Publisher Imprint: LAP Lambert Academic Publishing
  • Publication Date:
  • Pages: 80
  • Original Price: GBP 38.19
  • Language: English
  • Edition: N/A
  • Item Weight: 118 grams
  • BISAC Subject(s): Engineering (General)

This book presents a comprehensive and practical exploration of fatigue crack propagation in single-edge-notched (SEN) beams through the application of an exponential modelling framework. Designed for researchers, engineers, and advanced students, it bridges fundamental fracture mechanics with modern predictive methodologies for evaluating fatigue life. The text offers clear theoretical insights, validated analytical models, and illustrative case studies that demonstrate the accuracy and usefulness of exponential crack growth laws in structural assessment. By combining scientific rigor with accessible explanations, this book equips readers with the knowledge and tools needed to predict fatigue behaviour more reliably, enhance material integrity, and support safer, more efficient engineering designs.

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