Skip to content

Booksellers & Trade Customers: Sign up for online bulk buying at trade.atlanticbooks.com for wholesale discounts

Booksellers: Create Account on our B2B Portal for wholesale discounts

Fringe 2009: 6th International Workshop on Advanced Optical Metrology

by Wolfgang Osten
Save 35% Save 35%
Current price ₹22,035.00
Original price ₹33,899.00
Original price ₹33,899.00
Original price ₹33,899.00
(-35%)
₹22,035.00
Current price ₹22,035.00

Imported Edition - Ships in 12-14 Days

Free Shipping in India on orders above Rs. 500

Request Bulk Quantity Quote
+91
Book cover type: Paperback
  • ISBN13: 9783642431692
  • Binding: Paperback
  • Subject: N/A
  • Publisher: Springer
  • Publisher Imprint: Springer
  • Publication Date:
  • Pages: 792
  • Original Price: EUR 299.99
  • Language: English
  • Edition: 2009
  • Item Weight: 1139 grams
  • BISAC Subject(s): Industrial Engineering, Image Processing, and Physics / Optics & Light

From the Back Cover

The purpose of the Fringe Proceedings is to present to engineers, scientists and industrial experts the state-of-the-art and the impact of Optical Metrology in Imaging, Surface Monitoring, Stress Analysis, Non-Destructive Testing, Quality Control, and related fields.

Topics of particular interest are:

  • New Methods and Tools for the Generation, Acquisition, Processing, and Evaluation of Data in Optical Metrology (Digital Wavefront Engineering)
  • Application Enhanced Technologies in Optical Metrology (Addressing enhanced Resolution, Reliability and Flexibility)
  • 4D Optical Metrology over a Large Scale Range (from Macro to Nano)
  • Hybrid Measurement Techniques (Sensor Fusion and the Unification of Modeling, Simulation and Experiment)
  • New Optical Sensors and Measurement Systems for Industrial Inspection.

Special emphasis is put on modern measurement strategies, taking into account the active combination of physical modelling, computer aided simulation and experimental data acquisition. Special emphasis is directed towards new approaches for the extension of existing resolution limits that open the gates to wide scale metrology, ranging from nano to macro, by using advanced optical sensor systems.

Trusted for over 49 years

Family Owned Company

Secure Payment

All Major Credit Cards/Debit Cards/UPI & More Accepted

New & Authentic Products

India's Largest Distributor

Need Support?

Whatsapp Us