Skip to content

Booksellers & Trade Customers: Sign up for online bulk buying at trade.atlanticbooks.com for wholesale discounts

Booksellers: Create Account on our B2B Portal for wholesale discounts

Handbook of International Large-Scale Assessment: Background, Technical Issues, and Methods of Data Analysis

by Leslie Rutkowski
Save 35% Save 35%
Current price ₹4,315.00
Original price ₹6,637.00
Original price ₹6,637.00
Original price ₹6,637.00
(-35%)
₹4,315.00
Current price ₹4,315.00

Imported Edition - Ships in 12-14 Days

Free Shipping in India on orders above Rs. 500

Request Bulk Quantity Quote
+91
Book cover type: Paperback
  • ISBN13: 9781032477435
  • Binding: Paperback
  • Subject: N/A
  • Publisher: Taylor & Francis
  • Publisher Imprint: CRC Press
  • Publication Date:
  • Pages: 648
  • Original Price: GBP 50.99
  • Language: English
  • Edition: N/A
  • Item Weight: 960 grams
  • BISAC Subject(s): Testing & Measurement and Probability & Statistics / General

Winner of the 2017 AERA Division D Significant Contribution to Educational Measurement and Research Methodology Award!

Technological and statistical advances, along with a strong interest in gathering more information about the state of our educational systems, have made it possible to assess more students, in more countries, more often, and in more subject domains. The Handbook of International Large-Scale Assessment: Background, Technical Issues, and Methods of Data Analysis brings together recognized scholars in the field of ILSA, behavioral statistics, and policy to develop a detailed guide that goes beyond database user manuals.

After highlighting the importance of ILSA data to policy and research, the book reviews methodological aspects and features of the studies based on operational considerations, analytics, and reporting. The book then describes methods of interest to advanced graduate students, researchers, and policy analysts who have a good grounding in quantitative methods, but who are not necessarily quantitative methodologists. In addition, it provides a detailed exposition of the technical details behind these assessments, including the test design, the sampling framework, and estimation methods, with a focus on how these issues impact analysis choices.

Leslie Rutkowski, Matthias von Davier, David Rutkowski

Trusted for over 49 years

Family Owned Company

Secure Payment

All Major Credit Cards/Debit Cards/UPI & More Accepted

New & Authentic Products

India's Largest Distributor

Need Support?

Whatsapp Us