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Handbook of Silicon Semiconductor Metrology

by Alain C. Diebold
Save 35% Save 35%
Current price ₹5,810.00
Original price ₹8,938.00
Original price ₹8,938.00
Original price ₹8,938.00
(-35%)
₹5,810.00
Current price ₹5,810.00

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Book cover type: Paperback
  • ISBN13: 9780367397166
  • Binding: Paperback
  • Subject: N/A
  • Publisher: Taylor & Francis
  • Publisher Imprint: CRC Press
  • Publication Date:
  • Pages: 896
  • Original Price: GBP 69.99
  • Language: English
  • Edition: N/A
  • Item Weight: 2780 grams
  • BISAC Subject(s): Electronics / Semiconductors, Electrical, and Materials Science / General

Containing more than 300 equations and nearly 500 drawings, photographs, and micrographs, this reference surveys key areas such as optical measurements and in-line calibration methods. It describes cleanroom-based measurement technology used during the manufacture of silicon integrated circuits and covers model-based, critical dimension, overlay, acoustic film thickness, dopant dose, junction depth, and electrical measurements; particle and defect detection; and flatness following chemical mechanical polishing. Providing examples of well-developed metrology capability, the book focuses on metrology for lithography, transistor, capacitor, and on-chip interconnect process technologies.

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