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Integrated Imaging and Vision Techniques for Industrial Inspection: Advances and Applications

by Zheng Liu
Save 35% Save 35%
Current price ₹7,267.00
Original price ₹11,179.00
Original price ₹11,179.00
Original price ₹11,179.00
(-35%)
₹7,267.00
Current price ₹7,267.00

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Book cover type: Hardcover
  • ISBN13: 9781447167402
  • Binding: Hardcover
  • Subject: N/A
  • Publisher: Springer
  • Publisher Imprint: Springer
  • Publication Date:
  • Pages: 541
  • Original Price: EUR 99.99
  • Language: English
  • Edition: 2015
  • Item Weight: 1180 grams
  • BISAC Subject(s): Software Development & Engineering / Computer Graphics and Artificial Intelligence / Computer Vision & Pattern Recognition

From the Back Cover

This pioneering text/reference presents a detailed focus on the use of machine vision techniques in industrial inspection applications. An internationally renowned selection of experts provide insights on a range of inspection tasks, drawn from their cutting-edge work in academia and industry, covering practical issues of vision system integration for real-world applications.

Topics and features:

  • Presents a comprehensive review of state-of-the-art hardware and software tools for machine vision, and the evolution of algorithms for industrial inspection
  • Includes in-depth descriptions of advanced inspection methodologies and machine vision technologies for specific needs
  • Discusses the latest developments and future trends in imaging and vision techniques for industrial inspection tasks
  • Provides a focus on imaging and vision system integration, implementation, and optimization
  • Describes the pitfalls and barriers to developing successful inspection systems for smooth and efficient manufacturing process

Bridging the gap between theoretical knowledge and engineering practice, this indispensable book will appeal to graduate students interested in imaging, machine vision, and industrial inspection. The work also serves as an excellent reference for researchers seeking to develop innovative solutions to tackle practical challenges, and for professional engineers who will benefit from the coverage of applications at both system and component level.

Dr. Zheng Liu is an Associate Professor at the University of British Columbia, Kelowna, BC, Canada. Dr. Hiroyuki Ukida is an Associate Professor in the Institute of Technology and Science at the University of Tokushima, Japan. Dr. Pradeep Ramuhalli is a Senior Research Scientist at the Pacific Northwest National Laboratory, Richland, WA, USA. Dipl.-Ing. Kurt Niel is the Head of the Department of Metrology and Control Engineering at the University of Applied Sciences Upper Austria, Wels, Austria.

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