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Ionizing Radiation Effects in Mos Devices and Circuits

by T. P. Ma
Save 12% Save 12%
Current price ₹31,954.00
Original price ₹36,426.00
Original price ₹36,426.00
Original price ₹36,426.00
(-12%)
₹31,954.00
Current price ₹31,954.00

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Book cover type: Hardcover
  • ISBN13: 9780471848936
  • Binding: Hardcover
  • Subject: N/A
  • Publisher: Wiley-Interscience
  • Publisher Imprint: Wiley-Interscience
  • Publication Date:
  • Pages: 608
  • Original Price: GBP 287.95
  • Language: English
  • Edition: N/A
  • Item Weight: 948 grams
  • BISAC Subject(s): Electronics / Semiconductors and General

The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process-induced radiation effects in the fabrication of high-density circuits. Reviews the history of radiation-hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation-hardness research.

T. P. Ma and Paul V. Dressendorfer are the authors of Ionizing Radiation Effects in MOS Devices and Circuits, published by Wiley.

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