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Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces

by Sascha Sadewasser
Save 35% Save 35%
Current price ₹7,345.00
Original price ₹11,299.00
Original price ₹11,299.00
Original price ₹11,299.00
(-35%)
₹7,345.00
Current price ₹7,345.00

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Book cover type: Paperback
  • ISBN13: 9783642271137
  • Binding: Paperback
  • Subject: N/A
  • Publisher: Springer
  • Publisher Imprint: Springer
  • Publication Date:
  • Pages: 334
  • Original Price: EUR 99.99
  • Language: English
  • Edition: 2012
  • Item Weight: 495 grams
  • BISAC Subject(s): Materials Science / Thin Films, Surfaces & Interfaces, Mechanics / Thermodynamics, and Chemistry / General

From the Back Cover

In the nearly 20 years of Kelvin probe force microscopy an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.

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