Skip to content

Booksellers & Trade Customers: Sign up for online bulk buying at trade.atlanticbooks.com for wholesale discounts

Booksellers: Create Account on our B2B Portal for wholesale discounts

Low Substrate Temperature Modeling Outlook of Scaled N-Mosfet

by Nabil Shovon Ashraf
Save 35% Save 35%
Current price ₹2,424.00
Original price ₹3,728.00
Original price ₹3,728.00
Original price ₹3,728.00
(-35%)
₹2,424.00
Current price ₹2,424.00

Imported Edition - Ships in 12-14 Days

Free Shipping in India on orders above Rs. 500

Request Bulk Quantity Quote
+91
Book cover type: Paperback
  • ISBN13: 9783031009068
  • Binding: Paperback
  • Subject: N/A
  • Publisher: Springer
  • Publisher Imprint: Springer
  • Publication Date:
  • Pages: 77
  • Original Price: EUR 32.99
  • Language: English
  • Edition: N/A
  • Item Weight: 187 grams
  • BISAC Subject(s): Electrical, Electronics / Circuits / General, and Hardware / General

Low substrate/lattice temperature (

Dr. Nabil Shovon Ashraf was born in Dhaka, Bangladesh in 1974. Currently, Dr. Ashraf serves as an Associate Professor in the Department of Electrical and Computer Engineering of North South University, Dhaka, Bangladesh where he had previously served as an Assistant Professor from September 2014-June 2018. He obtained a Bachelor of Technology degree in Electrical Engineering from Indian Institute of Technology Kanpur, India in 1997. He obtained a Master of Science degree in Electrical Engineering from University of Central Florida, Orlando, USA in 1999. In 2011, he obtained his Ph.D. in Electrical Engineering from Arizona State University, Tempe, USA. From December 2011-May 2014, he wasa Post Doctoral Researcher in the department of Electrical Engineering of Arizona State University Tempe. He was employed as design engineer in RF Monolithics Inc., a surface acoustic wave-based filter design company in Dallas, Texas, USA from August 1999-March 2001. From October 2003â "June 2006, he served on the faculty as Assistant Professor of the Department of Electrical and Electronic Engineering at the Islamic University of Technology, Gazipur, Bangladesh. To date Dr. Ashraf has published 6 peer-reviewed journal articles (two IEEE EDS) and 15 international conference proceedings (3 IEEE EDS). In 2016, he published New Prospects of Integrating Low Substrate Temperatures with Scaling-Sustained Device Architectural Innovation with Morgan & Claypool and contributed to two book chapters on interface trap-induced threshold voltage fluctuations in the presence of random channel dopants of scaled n-MOSFET at the invitations of highly accomplished international book editors.

Trusted for over 49 years

Family Owned Company

Secure Payment

All Major Credit Cards/Debit Cards/UPI & More Accepted

New & Authentic Products

India's Largest Distributor

Need Support?

Whatsapp Us