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Noncontact Atomic Force Microscopy: Volume 2

by Seizo Morita
Save 35% Save 35%
Current price ₹16,009.00
Original price ₹24,628.00
Original price ₹24,628.00
Original price ₹24,628.00
(-35%)
₹16,009.00
Current price ₹16,009.00

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Book cover type: Paperback
  • ISBN13: 9783642260704
  • Binding: Paperback
  • Subject: N/A
  • Publisher: Springer
  • Publisher Imprint: Springer
  • Publication Date:
  • Pages: 401
  • Original Price: EUR 219.99
  • Language: English
  • Edition: 2009
  • Item Weight: 631 grams
  • BISAC Subject(s): Nanotechnology & MEMS, Materials Science / General, and Engineering (General)

From the Back Cover

Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.

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