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Radiation Effects & Soft Errors ...(V34)

by Ronald D. Schrimpf , Daniel M. Fleetwood
Save 17% Save 17%
Current price ₹16,604.00
Original price ₹19,925.00
Original price ₹19,925.00
Original price ₹19,925.00
(-17%)
₹16,604.00
Current price ₹16,604.00

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Book cover type: Hardcover
  • ISBN13: 9789812389404
  • Binding: Hardcover
  • Subject: N/A
  • Publisher: World Scientific Publishing Company
  • Publisher Imprint: World Scientific Publishing Company
  • Publication Date:
  • Pages: 348
  • Original Price: USD 162.0
  • Language: English
  • Edition: N/A
  • Item Weight: 681 grams
  • BISAC Subject(s): Electrical

This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.

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