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Radiation Status of Sub-65 NM Electronics

by Jonathan a. Pellish
Save 31% Save 31%
Current price ₹1,072.00
Original price ₹1,544.00
Original price ₹1,544.00
Original price ₹1,544.00
(-31%)
₹1,072.00
Current price ₹1,072.00

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Book cover type: Paperback
  • ISBN13: 9781289013929
  • Binding: Paperback
  • Subject: N/A
  • Publisher: Bibliogov
  • Publisher Imprint: Bibliogov
  • Publication Date:
  • Pages: 28
  • Original Price: USD 15.75
  • Language: English
  • Edition: N/A
  • Item Weight: 68 grams
  • BISAC Subject(s): General

Ultra-scaled complementary metal oxide semiconductor (CMOS) includes commercial foundry capabilities at and below the 65 nm technology node Radiation evaluations take place using standard products and test characterization vehicles (memories, logic/latch chains, etc.) NEPP focus is two-fold: (1) Conduct early radiation evaluations to ascertain viability for future NASA missions (i.e. leverage commercial technology development). (2) Uncover gaps in current testing methodologies and mechanism comprehension -- early risk mitigation.

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