From the Back Cover
This book presents the select proceedings of the 11th National Conference on Advances in Metrology (AdMet 2022). The book highlights and discusses the recent technological developments in the areas of fundamental and quantum metrology, physico-mechanical and electrical metrology, time and frequency metrology, materials metrology, industrial and legal metrology, digital transformation in metrology, among others. This book is aimed for those engaged in conformity assessment, quality system management, calibration, and testing in all sectors of industry. The book is a valuable reference for metrologists, scientists, engineers, academicians, and students from research institutes and industrial establishments to explore the future directions and research in the areas of sensors, advance materials, measurements, and quality improvement.
Sanjay Yadav, born in 1962, obtained his master degree in science (M.Sc.) in 1985 and Ph.D. degree in Physics in 1990. He is Former Chief Scientist and Head, Physico Mechanical Metrology Division of NPL and also Former Professor, Faculty of Physical Sciences, Academy of Scientific and Innovative Research (AcSIR), HRDG, Ghaziabad. Presently, he is working as the Editor-in-Chief (EIC) of the MAPAN: The Journal of Metrology Society of India. He is also Vice President of Metrology Society of India (MS), New Delhi as well as Vice President of Ultrasonic Society of India (USI), New Delhi. He had taught 'Advanced Measurement Techniques & Metrology' course, taken practical classes and supervising graduate, master and Ph.D. students since 2011 to 2022. He is the recipient of research scholarships from Ministry of Home Affairs, India (1986); CSIR, India (1988); Col. G.N. Bajpayee Award of Institution of Engineers, India (1989); Commendation Certificates from Haryana Government (1991 & 1992); JICA Fellowship of JAPAN (1998), Commendation Certificates from SASO, Saudi Arabia (2003); 3 Appreciation Certificates from Director, NPL (2005); Managing Editor, MAPAN (2006-2014); nominated as Member of APMP Technical Committee of Mass Related Quantities (TCM), Australia (2013-2019); Nominated as Country Representative in APMP, China (2019); Member, National Advisory Committee, NCERT, Delhi (2019); Members, Testing and Calibration Advisory Committee, BIS (2019, 2020 and 2021), Certified NABL Assessor as per ISO/IEC 17025:2017, very recently received a prestigious International award i.e. APMP Award for Developing Economies, China (2020), Governing Council Member of Fluid Controls Research Institute (FCRI), Palghat (2022), and Member of several Committees of International Measurement Confederation (IMEKO) including Governing Council since 2018. He has significantly contributed in the field of pressure metrology, biomedical instrumentation, ultrasonic transducers and instrumentation systems. His current research interests include research and developmental activities in physico mechanical measurements; establishment, realization, maintenance and up-gradation of national pressure and vacuum standards; dissemination of national practical pressure scale to users through apex level calibration, training and consultancy services; inter-laboratory comparisons, proficiency testing programme and key comparisons, implementation of Quality System in the laboratory as per ISO/IEC 17025 standard and Finite Element Analysis (FEA) and Monte Carlo Simulations for pressure balances. He has published more than 450 research papers in the national and international journals of repute and conferences, edited 20 books, 14 patents and copyrights, supervised 8 PhDs (another 5 in waiting), drafted several projects, scientific and technical reports, documents and policy papers. Naveen Garg is Senior Principal Scientist and Head, Acoustics and Vibration Standards in CSIR-National Physical Laboratory, New Delhi, working in the field of sound and vibration since the past 19 years. He is Mechanical Engineer specializing in machine design, vibrations and acoustics, measurement science and working in development and upgradation of primary standards of sound pressure and vibration amplitude and R&D in Applied Acoustics. He has done his Doctorate in mechanical engineering from Delhi Technological University, Delhi, and M.Tech. in Machine Design from Indian Institute of Technology (IIT) Delhi. He has been Managing Editor of MAPAN-Journal of Metrology Society of India published by Springer and reviewer of many international journals and has enormously contributed towards evaluation, analysis and control of noise pollution.
Shankar G. Aggarwal is working at CSIR-NPL as Senior Principal Scientist (Professor (AcSIR)) from 2009, and his current research focus is ''metrology for national ambient air quality standar^ 100 talks including talks in 15 different countries. He was the fellow of Japan Society for the Promotion of Science, JSPS (2005-2007), Recipient of CITAC award -2013, NABL assessor of ISO/IEC 17025:2017 & ISO 17034:2016, Associate Editor of Mapan-JMSI and Asian Journal of Atmospheric Environment, member of BIPM GAWG Task Group on Particulate Matter Comparison, member of APMP Focus Group on Climate Change and Clean Air (FG-CCCA), etc.
Shiv Kumar Jaiswal obtained his B.E. (Electrical Engg.), M.Tech. (Electrical Engg.) and Ph.D. (Fluid Flow) degrees in 1994, 1996 and 2016 respectively. He is currently working as a Senior Principal Scientist and Head--Fluid Flow Metrology Section of CSIR--National Physical Laboratory (NPLI), New Delhi. He has more than 25 years of research, industrial and academic experience. He has been active Researcher in the field of electrical and fluid flow metrology. He has worked as Guest Researcher for one year in Quantum Electrical Metrology Division of National Institute of Standards and Technology (NIST), Gaithersburg, USA, during year 2006-07. He is Member of several committees of Bureau of Indian Standards (BIS), National Accreditation Board for Testing and Calibration Laboratories (NABL), Legal Metrology Department, Central Ground Water Authority, APMP Technical Committee for Fluid Flow (TCFF), International Measurement Confederation (IMEKO), etc. He has authored more than 59 publications in peer-reviewed journals, conferences, and book chapters. He is Managing Editor of MAPAN--Journal of Metrology Society of India and Vice President, Metrology Society of India. Harish Kumar is currently working as Associate Professor & Dean Academic at the National Institute of Technology (NIT), Delhi. With more than 20 years of research and academic experience, he is an active researcher in the area of mechanical measurement and metrology. He served as Scientist at the National Physical Laboratory, India, for more than a decade, and as Guest Researcher at the National Institute of Standards and Technology, USA, in 2016. He has authored more than 150 publications in peer-reviewed journals and conference proceedings. He is an active reviewer for many prominent journals on measurement, metrology, and related areas and is Associate Editor of the MAPAN/Journal of Metrology Society of India, published by Springer.
Venu Gopal Achanta is a Noted Physicist, Nanophotonics expert, Metrologist and Science Leader, who joined CSIR-NPL as its Director in June 2021. He also held responsibility of another esteemed CSIR laboratory, i.e., CSIR-IGIB, New Delhi during April-December 2022. He did his M.Sc. in Physics from Central University Hyderabad. He obtained Ph.D. in Physics from TIFR in 2000 for his work on Exciton dynamics in low-dimensional semiconductors. In 2006, he was awarded Ph.D. in Electronics Engineering from Tokyo University for work ondesign and demonstration of an ultrafast all-optical switch. He joined TIFR as faculty in 2004 where he is a Professor (H) since 2018. His research interests include classical and quantum information processing with dipolar emitters like quantum dots embedded in photonic and nanophotonic structures, single photon metrology, dissemination of apex metrological traceability through world-class measurement standards, BNDs, skill development in the country, and strengthening the national quality infrastructure for the overall economic growth of the country.
