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Scanning Microscopy for Nanotechnology: Techniques and Applications

by Weilie Zhou , Zhong Lin Wang
Save 17% Save 17%
Current price ₹25,621.00
Original price ₹30,746.00
Original price ₹30,746.00
Original price ₹30,746.00
(-17%)
₹25,621.00
Current price ₹25,621.00

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Book cover type: Hardcover
  • ISBN13: 9780387333250
  • Binding: Hardcover
  • Subject: N/A
  • Publisher: Springer
  • Publisher Imprint: Springer
  • Publication Date:
  • Pages: 522
  • Original Price: USD 249.99
  • Language: English
  • Edition: 2007
  • Item Weight: 1048 grams
  • BISAC Subject(s): Nanotechnology & MEMS

This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.

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