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Scanning Probe Microscopy

by Kate Wright
Save 12% Save 12%
Current price ₹8,912.00
Original price ₹10,119.00
Original price ₹10,119.00
Original price ₹10,119.00
(-12%)
₹8,912.00
Current price ₹8,912.00

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Book cover type: Hardcover
  • ISBN13: 9781632384072
  • Binding: Hardcover
  • Subject: N/A
  • Publisher: NY Research Press
  • Publisher Imprint: NY Research Press
  • Publication Date:
  • Pages: 256
  • Original Price: GBP 79.99
  • Language: English
  • Edition: N/A
  • Item Weight: 513 grams
  • BISAC Subject(s): Microscopes & Microscopy

Scanning Probe Microscopy (SPM) involves forming images of surfaces using a physical scanning and detection method. The key subject of this text, scanning probe microscopy is a major tool for the progress of nanotechnology with functions in a multitude of study spheres. This book comprises of unique studies on the uses of SPM methods for the classification of physical attributes of various materials at the nano level. The various topics covered in this book vary from morphology of surfaces to analyzing thin films. The diversity of topics covered in this book reflects the prominent interdisciplinary trait of the study in the sphere of scanning probe microscopy.

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