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Scientific Examination of Questioned Documents

by Michael S. Bisesi
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Current price ₹16,540.00
Original price ₹27,566.00
Original price ₹27,566.00
Original price ₹27,566.00
(-40%)
₹16,540.00
Current price ₹16,540.00

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Book cover type: Hardcover
  • ISBN13: 9780849320446
  • Binding: Hardcover
  • Subject: N/A
  • Publisher: Taylor & Francis Inc
  • Publisher Imprint: CRC Press
  • Publication Date:
  • Pages: 488
  • Original Price: GBP 220.0
  • Language: English
  • Edition: 2nd Edition
  • Item Weight: 1064 grams
  • BISAC Subject(s): Forensic Science

Considered the forensic document examiner's bible, Scientific Examination of Questioned Documents is an authoritative and comprehensive reference that focuses on the pertinent advancements made within the field. This newest edition presents the qualifications necessary for a well-trained examiner and details the most up-to-date methodologies used in the field. An essential guide for the novice and the seasoned professional, it is also an informative reference for the layperson who is interested in the subject.

Featuring chapters written by several forensic document examination experts, this new edition is extensively revised to reflect post-1982 developments. Since that time, new avenues of written communication have emerged, as well as the proliferation of desktop computers and printers. Both of these factors have strongly impacted the nature of the examinations performed and the methodologies used. The book thoroughly explores the complexities involved in keeping current with these developments and does so, in some instances, aided by the presentation of a variety of documents and case studies.

Discussion topics include infra-red exams, the use of computer hardware and software in document examination, and innovative chart making techniques. New chapters cover computer printer technologies, facsimiles, techniques for the detection of digitally manipulated documents and photocopies, ASTM standards for reporting conclusions along with advanced examination techniques. Updated chapters include expanded discussion of ESDA and other analytical tools, document dating, modern stamp making technology, and more.

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