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Statistical Analysis of Microstructures in Materials Science

by Joachim Ohser
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Current price ₹22,305.00
Original price ₹25,421.00
Original price ₹25,421.00
Original price ₹25,421.00
(-12%)
₹22,305.00
Current price ₹22,305.00

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Book cover type: Hardcover
  • ISBN13: 9780471974864
  • Binding: Hardcover
  • Subject: N/A
  • Publisher: Wiley
  • Publisher Imprint: Wiley
  • Publication Date:
  • Pages: 404
  • Original Price: GBP 200.95
  • Language: English
  • Edition: N/A
  • Item Weight: 685 grams
  • BISAC Subject(s): Nanoscience, Materials Science / General, and Engineering (General)

The investigation of the origin and formation of microstructures and the effect that microstructure has on the properties of materials are important issues in materials science and technology. Geometrical analysis is often the key to understanding the formation of microstructures and the resulting material properties. The authors make use of mathematical morphology, spatial statistics, image processing, stereology and stochastic geometry to analyze microstructures arising in materials science.
* Quantitative microstructure analysis is one of the most successful experimental techniques in materials science
* Uses examples to demonstrate the techniques
* Program code included enables the reader to apply the numerous algorithms
* Accessible to material scientists with limited statistical knowledge
Primarily aimed at applied materials scientists, the book will also appeal to those working and researching in earth sciences, material technology, mineralogy, petrography, image analysis, cytology and biology.

Joachim Ohser holds a Chair at University of Applied Sciences, Darmstadt, Germany, where he is a professor in the field of image processing. He has long experience with characterization and geometric modelling of microstructures. Since 1999 he heads the working group on quantitative microstructural analysis of the German Materials Society. His research focuses on stochastic and discrete geometry, image analysis and simulation of materials properties.

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