Skip to content

Booksellers & Trade Customers: Sign up for online bulk buying at trade.atlanticbooks.com for wholesale discounts

Booksellers: Create Account on our B2B Portal for wholesale discounts

Strain and Dislocation Gradients from Diffraction: Spatially-Resolved Local Structure and Defects

by Rozaliya I. Barabash , Gene Ice
Save 17% Save 17%
Current price ₹17,777.00
Original price ₹21,333.00
Original price ₹21,333.00
Original price ₹21,333.00
(-17%)
₹17,777.00
Current price ₹17,777.00

Imported Edition - Ships in 18-21 Days

Free Shipping in India on orders above Rs. 500

Request Bulk Quantity Quote
+91
Book cover type: Hardcover
  • ISBN13: 9781908979629
  • Binding: Hardcover
  • Subject: N/A
  • Publisher: Imperial College Press
  • Publisher Imprint: Imperial College Press
  • Publication Date:
  • Pages: 480
  • Original Price: USD 173.0
  • Language: English
  • Edition: N/A
  • Item Weight: 862 grams
  • BISAC Subject(s): Electron Microscopes & Microscopy

This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals.Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating.

Trusted for over 49 years

Family Owned Company

Secure Payment

All Major Credit Cards/Debit Cards/UPI & More Accepted

New & Authentic Products

India's Largest Distributor

Need Support?

Whatsapp Us