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Surface Metrology for Micro- and Nanofabrication

by Wei Gao
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Current price ₹12,382.00
Original price ₹20,636.00
Original price ₹20,636.00
Original price ₹20,636.00
(-40%)
₹12,382.00
Current price ₹12,382.00

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Book cover type: Paperback
  • ISBN13: 9780128178508
  • Binding: Paperback
  • Subject: N/A
  • Publisher: Elsevier
  • Publisher Imprint: Elsevier
  • Publication Date:
  • Pages: 448
  • Original Price: USD 220.0
  • Language: English
  • Edition: N/A
  • Item Weight: 772 grams
  • BISAC Subject(s): Materials Science / General

Surface Metrology for Micro- and Nanofabrication presents state-of-the-art measurement technologies for surface metrology in fabrication of micro- and nanodevices or components. This includes the newest general-purpose scanning probe microscopes, and both contact and non-contact surface profilers. In addition, the book outlines characterization and calibration techniques, as well as in-situ, on-machine, and in-process measurements for micro- and nanofabrication.

Gao, Wei: - Prof. Wei Gao is the Chair of the Precision Nanometrology Laboratory and Director of the Research Center for Precision Nanosystems at the Department of Fine Mechanics in the Graduate School of Engineering, Tohoku University, Japan. His research focuses on precision engineering, precision metrology, micro/nano-nanometrology, optical sensors, surface metrology, on-machine and in-process measurement, and motion measurement.

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