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Utilizing Near-Field Measurements to Characterize Far-Field Radar Signatures

by John R. Watkins
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Current price ₹5,110.00
Original price ₹5,974.00
Original price ₹5,974.00
Original price ₹5,974.00
(-14%)
₹5,110.00
Current price ₹5,110.00

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Book cover type: Paperback
  • ISBN13: 9781288313976
  • Binding: Paperback
  • Subject: N/A
  • Publisher: Biblioscholar
  • Publisher Imprint: Biblioscholar
  • Publication Date:
  • Pages: 114
  • Original Price: GBP 45.95
  • Language: English
  • Edition: N/A
  • Item Weight: 218 grams
  • BISAC Subject(s): General

The increased need for stealth aircraft requires an on-site Far-Field (FF) Radar Cross-Section (RCS) measurement process. Conducting these measurements in on-site Near-Field (NF) monostatic facilities results in significantsavings for manufacturers and acquisition programs.How-ever, NF measurements are not directly extended to a FF RCS. Therefore, a large target Near-Field to Far-Field Transformation (NFFFT) is needed for RCS measurements. One approach requires an Inverse Synthetic Aperture Radar (ISAR) process to create accurate scattering maps. The focus of this work is the development of accurate NF scattering maps generated by a monostatic ISAR process.As a first look, the process is isolated to a simulated environment to avoid the uncontrollable effects ofrealmeasurement environments.The simulation begins witha NF Synthetic Target Generator (STG) which approximates a target using scattering centers illuminated by spherical electromagnetic waves to approximating NF scattering. The resulting NF In-phase and Quadrature (IQ) data is used in a 'Trapezoidal' ISAR process to create spatially distorted images that are accurately corrected within the ISAR process resolution using a newly developed NF correction. The resulting spatially accurate ISAR images do not complete the NFFFT. However, accurate scattering maps are essential for process development.

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