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VLSI Implementation of Built in Self-Test

by M. Fatima , Shubham Sahu
Save 12% Save 12%
Current price ₹4,232.00
Original price ₹4,832.00
Original price ₹4,832.00
Original price ₹4,832.00
(-12%)
₹4,232.00
Current price ₹4,232.00

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Book cover type: Paperback
  • ISBN13: 9786207807802
  • Binding: Paperback
  • Subject: N/A
  • Publisher: LAP Lambert Academic Publishing
  • Publisher Imprint: LAP Lambert Academic Publishing
  • Publication Date:
  • Pages: 64
  • Original Price: GBP 38.19
  • Language: English
  • Edition: N/A
  • Item Weight: 100 grams
  • BISAC Subject(s): Electronics / General

Built-in Self-Test (BIST) is a technique that integrates additional hardware and software into integrated circuits, enabling them to perform self-testing. A key component often used in BIST is the Linear Feedback Shift Register (LFSR), a shift register where the input bit is a linear function of its previous state.BIST is the standard method for testing embedded memories. Over time, memory BIST techniques have evolved to address the growing demands of advanced technologies and markets. BIST improves testing efficiency by allowing full-speed memory access and reducing manufacturing test time through rapid, on-chip pattern generation.This book focuses on implementing BIST using Verilog HDL on Xilinx ISE 14.7. It includes the design of an LFSR and an SRAM controller to support BIST, enhancing overall system performance.

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