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X-Ray Line Profile Analysis in Materials Science

by Jenő Gubicza
Save 17% Save 17%
Current price ₹21,835.00
Original price ₹26,202.00
Original price ₹26,202.00
Original price ₹26,202.00
(-17%)
₹21,835.00
Current price ₹21,835.00

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Book cover type: Hardcover
  • ISBN13: 9781466658523
  • Binding: Hardcover
  • Subject: N/A
  • Publisher: Engineering Science Reference
  • Publisher Imprint: Engineering Science Reference
  • Publication Date:
  • Pages: 359
  • Original Price: GBP 172.0
  • Language: English
  • Edition: N/A
  • Item Weight: 840 grams
  • BISAC Subject(s): Materials Science / General

X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.

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