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X-Ray Microscopy and Spectromicroscopy: Status Report from the Fifth International Conference, Würzburg, August 19-23, 1996

by Jürgen Thieme
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Current price ₹3,672.00
Original price ₹5,649.00
Original price ₹5,649.00
Original price ₹5,649.00
(-35%)
₹3,672.00
Current price ₹3,672.00

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Book cover type: Paperback
  • ISBN13: 9783642721083
  • Binding: Paperback
  • Subject: N/A
  • Publisher: Springer
  • Publisher Imprint: Springer
  • Publication Date:
  • Pages: 383
  • Original Price: EUR 49.99
  • Language: English
  • Edition: 1998
  • Item Weight: 613 grams
  • BISAC Subject(s): Optics, Physics / Crystallography, and Materials Science / Thin Films, Surfaces & Interfaces

From the Back Cover
This book contains state-of-the-art reviews and up-to-date progress reports in the field of X-ray microscopy and spectromicroscopy, including related new X-ray optics and X-ray sources. It reflects the lively activities in a relatively new field of science which combines the development of new instruments and methods with their applications to numerous topical scientific questions. The applications range from biological and medical topics, colloid physics, and soil sciences to solid-state physics, material sciences, and surface sciences. The book appeals to researchers who are active in microscopic and spectromicroscopic studies.

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